Microscopy with light and electrons

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Attribution text:	By John Humphreys, Peter J. Goodhew, Richard Beanland, released under CC BY-SA 2.0 license
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Resource type:	Text
Description:	The chapter gives the basic principles of microscopy
Keywords:	ray diagrams • magnification • optical systems • resolution • depth of field • electron microscopy • analysis • book
Categories:	Properties > Electrical, magnetic & optical > Optical Testing, analysis & experimentation > Microscopy Scale > Micro
Created by:	John Humphreys, Manchester Materials Science Centre Peter J. Goodhew, Department of Engineering, The University of Liverpool Richard Beanland, Marconi Materials Technology, Towcester
License:	This resource is released under the Creative Commons Attribution Share Alike license (2.0 UK: England & Wales). You are free: to share – to copy, distribute and transmit the work to remix – to adapt the work Under the following conditions: attribution – You must attribute the work in the manner specified by the author or licensor (but not in any way that suggests that they endorse you or your use of the work). share alike – If you alter, transform, or build upon this work, you may distribute the resulting work only under the same or similar license to this one. View the full legal code here.
Date created:	01 January 2001
Date added:	17 February 2010
Package:	Electron Microscopy and Analysis
Resource ID:	2707
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