Text icon  The scanning electron microscope

 
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Description: The chapter gives insight into the scanning electron microscope technique
Keywords: secondary electrons • interaction volume • backscattered electrons • imaging methods • image processing • SEM imaging methods
Categories: Testing, analysis & experimentation > Metallography
Testing, analysis & experimentation > Microscopy
Scale > Micro
Created by: John Humphreys, Manchester Materials Science Centre
Peter J. Goodhew, Department of Engineering, The University of Liverpool
Richard Beanland, Marconi Materials Technology, Towcester
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Date created: 01 January 2001
Date added: 17 February 2010
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Resource ID: 2712