Text icon  Chemical analysis in the electron microscope

 
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Description: The chapter describes principles of the chemical analysis in the SEM and TEM.
Keywords: characteristic X-rays • X-ray spectrometry • microprobe analysis • thin film analysis • correction methods • EELS • electron energy loss spectrometry
Categories: Testing, analysis & experimentation > Metallography
Testing, analysis & experimentation > Microscopy
Scale > Micro
Created by: John Humphreys, Manchester Materials Science Centre
Peter J. Goodhew, Department of Engineering, The University of Liverpool
Richard Beanland, Marconi Materials Technology, Towcester
License: This resource is released under the Creative Commons Attribution Share Alike license (2.0 UK: England & Wales).
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Date created: 01 January 2001
Date added: 17 February 2010
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Resource ID: 2713