Interactive Resource icon  Techniques for Studying Materials: Atomic Force Microscopy

 
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Resource type: Interactive Resource
Description: This set of animations provides understanding of what Atomic Force Microscopy is and how it is used. From TLP: Atomic Force Microscopy
Keywords: afm • atomic force microscopy • surface morphology • cantilever deflection • contact • mode • tapping • artefact • nanotechnology • lateral force imaging
Categories: Materials
Testing, analysis & experimentation
Testing, analysis & experimentation > Microscopy
Scale > Nano(-materials)
Created by: DoITPoMS, University of Cambridge
Amy Li, University of Cambridge
Pete Coombe, University of Cambridge
Rachel Oliver, University of Cambridge
Published by: DoITPoMS, University of Cambridge
License: This resource is released under the Creative Commons Attribution Non-Commercial Share Alike license (2.0 UK: England & Wales).
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Date created: 01 August 2009
Date added: 05 March 2010
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Resource ID: 2732