Interactive Resource icon  Functional Behaviour of Materials: Electromigration

 
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Resource type: Interactive Resource
Description: This set of animations covers electromigration damage and resistance to it. It introduces the concept Blech length. From TLP: Electromigration
Keywords: electromigration • flux divergence • metallisation • integrated circuits • failure • aluminium • copper
Categories: Materials
Materials > Metals & alloys > Aluminium & alloys
Testing, analysis & experimentation
Created by: DoITPoMS, University of Cambridge
Lindsay Greer, University of Cambridge
Joo Ching Chua, University of Cambridge
Published by: DoITPoMS, University of Cambridge
License: This resource is released under the Creative Commons Attribution Non-Commercial Share Alike license (2.0 UK: England & Wales).
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Date created: 01 June 2006
Date added: 05 March 2010
Package:
Resource ID: 2759