Presentation icon  In touch with Atoms

 
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Resource type: Presentation
Description:

In touch with Atoms

    Topics:
  • Imaging With Energy Beams
  • Energy Beam - Material Interactions
  • Imaging Modes
  • Addition Imaging Features
  • Examples of FIB Technology
  • Three Modes of FIB
  • Radiation Damage of FIB
  • Impact of GA Doping
  • The Scanning Probe System
  • Scanning Tunneling Microscopy
  • STM Components
  • Tunneling Current
  • Two Modes of Forming STM Images
  • Nanofabrication by STM
  • Tunable Bond Formation by STM
  • STM Manipulation
  • Scanning Probe System

Keywords: FIB • STM • scanning probe • energy beam • tunneling • anodizing • imaging • nanofabrication • presentation
Categories: Materials > Ceramics & glasses > Technical ceramics > Carbon and graphite
Testing, analysis & experimentation
Testing, analysis & experimentation > Microscopy
Scale > Nano(-materials)
Created by: Nicholas X. Fang, University of Illinois at Urbana-Champaign
License: This resource is released under the Creative Commons Attribution Non-Commercial Share Alike license (3.0 Unported).
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Date created: 11 May 2009
Date added: 25 January 2011
Package:
Resource ID: 3361