Interactive Resource icon   Package: Virtual SEM

 
Use this resource: Use this resource icon
Link to this page: http://core.materials.ac.uk/search/detail.php?id=3793
View at:    
Resource type: Interactive Resource
Description: This package gives you the opportunity to 'play' with a virtual Scanning Electron Microscope (SEM) by following the guided instructions. Interactive simulations of a SEM provide imaging for four different types of samples. The simulations show the affect of such settings as accelerating voltage, spot size, Z-depth, filament current, magnification, and astigmatism. This package will not make you an overnight expert in SEM, but it will provide the essential skills needed to begin experimentation and provide the scaffolding necessary to become a full-fledged electron microscopist through practice and perseverance.
Keywords: scanning electron microscope • SEM • back-scattering electron microscopy • BSE • accelerating voltage • spot size • Z-depth • filament current • magnification • astigmatism • simulation
Categories: Testing, analysis & experimentation > Microscopy
Created by: Australian Microscopy & Microanalysis Research Facility
License: This resource is released under the Creative Commons Attribution Non-Commercial Share Alike license (2.5 Generic).
Creative Commons Attribution Non-Commercial Share Alike logo
You are free:
  • to share – to copy, distribute and transmit the work
  • to remix – to adapt the work
Under the following conditions:
  • attribution – You must attribute the work in the manner specified by the author or licensor (but not in any way that suggests that they endorse you or your use of the work).
  • noncommercial – You may not use this work for commercial purposes.
  • share alike – If you alter, transform, or build upon this work, you may distribute the resulting work only under the same or similar license to this one.
View the full legal code here.
Date created: 21 July 2011
Date added: 25 April 2012
Package:
Resource ID: 3793