Interactive Resource icon   Package: Virtual SEM

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Resource type: Interactive Resource
Description: This package gives you the opportunity to 'play' with a virtual Scanning Electron Microscope (SEM) by following the guided instructions. Interactive simulations of a SEM provide imaging for four different types of samples. The simulations show the affect of such settings as accelerating voltage, spot size, Z-depth, filament current, magnification, and astigmatism. This package will not make you an overnight expert in SEM, but it will provide the essential skills needed to begin experimentation and provide the scaffolding necessary to become a full-fledged electron microscopist through practice and perseverance.
Keywords: scanning electron microscope • SEM • back-scattering electron microscopy • BSE • accelerating voltage • spot size • Z-depth • filament current • magnification • astigmatism • simulation
Categories: Testing, analysis & experimentation > Microscopy
Created by: Australian Microscopy & Microanalysis Research Facility
License: This resource is released under the Creative Commons Attribution Non-Commercial Share Alike license (2.5 Generic).
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Date created: 21 July 2011
Date added: 25 April 2012
Resource ID: 3793